ISOCOM LTD: BSI9000 and CECC20000 Approved Manufacturer

Hutton Close, Crowther Ind Est, Washington, Tyne & Wear NE38 0AH, England
Email: enquiry@isocomoptocouplers.com - Tel: +44 (0)191 4166546 - Fax: +44 (0)191 4155055

High Reliability Processing and Selection Guide

High Reliability Processing
Quality Conformance Testing
100% Screening Options
BS9400 Detail Specification Requirements
100% Processing
Group A Electrical Tests
Group B Tests
Group C Periodic Tests
Group D Periodic Testing
Quality Assessment Categories
Selection Guide
Ordering Information
Home Page


High Reliability Processing

Isocom Ltd's high reliability processing is based upon BS9000 or CECC20000 test methods, and consists of:

  1. 100% internal visual inspection (cond. B) - [L2, L3, B, C only]
  2. 100% isolation leakage current testing
  3. 100% testing at -55°C and +125°C
  4. 100% one week burn in [L2, L4, B, D only]
  5. 100% hermeticity testing [L2, L4, B, C only]
  6. Group A and B lot-by-lot tests on samples drawn from each inspection lot
  7. Group C and D periodic tests on samples drawn every 3 and 6 months

Isocom Ltd products are assembled under clean room conditions. All processing and testing is strictly controlled as part of an integrated QA programme.

Quality Conformance Testing

The following tables summarise the main test requirements for Isocom Ltd's BS9400 and CECC20000 released product. The tables are for guidance only, and specific test requirements are contained in the BS9400/CECC20000 detail specifications, which can be obtained from Isocom Ltd. Comparisons between BS9000, CECC and MIL-STD-883C are also for guidance only, as detail differences do exist between some of the cross referenced test methods.

100% Screening Options

(Provisional information for CECC 20000)

TESTING
METHOD
BS9400/ L2
CECC20000/B
BS9400/L3
CECC20000/C
BS9400/L4
CECC20000/D
UNSCREENED
PRE-CAP INSPECTIONYY--
PRODUCTION TESTYYYY
STABILISATION BAKEYY--
RAPID CHANGE OF TEMPERATUREYY--
CONSTANT ACCELERATIONYY--
HERMETICITY TESTYY--
PRE-BURN IN TESTY-Y-
168h BURN INY-Y-
POST-BURN IN TESTY-Y-
FINAL ELECTRICAL TESTYYY-
GROUP A,B,C,D SAMPLESYYYY
BONDED STOREYYYY
RELEASEYYYY

BS9400 Detail Specification Requirements

100% Processing

(Sub-Group AOa and AOc)

TESTBS9400 para
(or DS - as detail spec)
Comparable Test MethodsCONDITIONS
CECC20000
Clause
MIL-STD-
883C Method
Int. Visual1.2.10/BN/A2017/B
Stab. Bake1.2.6.34.4.11008/C24h (min) @ 150°C
Temp. Cycle1.2.6.134.4.41010/C-65°C/+150°C, 10 cycles
Const. Acceleration1.2.6.94.4.112001/A49000 m/s2 (5000g), Y1 axis, 1 minute
Fine Leak1.2.6.14 (Qk)4.4.10 (Qk)1014/ATracer Gas (Helium) Method
Gross Leak1.2.6.14 (Qc)4.4.10 (Qc)1014/CFluorocarbon "Bubble" Method
Pre-Burn-in ElectricalDS--Static Characteristics (except IIO)
Burn-in1.2.9.24.51015/B160h (min) @ 125°C
Post-Burn-in ElectricalDS--Static characteristics (except IIO)
PDA Calc1.2.9.1--5% PDA
Final Electrical TestsDS--Static Characteristics @ -55°C, 25°C, 125°C
Switching/Propagation Delay Time Tests @ 25°C
External Visual1.2.24.2.12009

Group A Electrical Tests

(Non-destructive, lot-by-lot)

SUB-
GROUP
TESTBS9400 para
(or DS - as detail spec)
Comparable Test MethodsTAMBSAMPLE
CECC20000
Clause
MIL-STD-
883C Method
I.L.A.Q.L.
AO(b)Input-Output Isolation Leakage Current2013--25°C100%
AO(c)Operation at Tamb (max); (L2, L3, L4 only)DS--125°C
Operation at Tamb (min); (L2, L3, L4 only)-55°C
A1Visual Inspection1.2.14.2.1200925°CII0.25%
Statistic CharacteristicsDS--
A2InoperativesDS--25°C
A3aPropagation Delay TimesDS--25°CII0.25%
A3bCommon Mode Transient Immunity (if applicable)DS--25°CS41.5%
A4aStatic Characteristics at Tamb (max)DS--125°CS40.25%
A4bPropagation Delay Times at Tamb (max)DS--125°C
A4cStatic Characteristics at Tamb (min)DS---55°C
A4dPropagation Delay Times at Tamb (min)DS---55°C

Group B Tests

(Non-destructive, lot-by-lot)

SUB-
GROUP
TESTBS9400 para
(or DS - as detail spec)
Comparable Test MethodsCONDITIONSSAMPLE
CECC20000
Clause
MIL-STD-
883C Method
I.L.A.Q.L.
B1Dimensions1.2.34.2.22016-S26.5
B2Solderability1.2.6.15.14.4.7(1)2003Solder Bath MethodS44.0
B4a(D)Resistance to SolventsDS-2015-S22.5
B3aRapid Change of Temperature1.2.6.134.4.41010/C-65°C/+150°C, 5 CyclesS44.0
Fine Leak Test1.2.6.14 (Qk)4.4.10 (Qk)1014/ATracer Gas (Helium)
Gross Leak Test1.2.6.14 (Qc)4.4.10 (Qc)1014/CFluorocarbon Bubble
B3b(D)Robustness of Terminations1.2.6.16.34.4.9-Bending-Row of TerminationsS24.0
B3cAcceleration, Steady State1.2.6.94.4.112001/A49000 m/s2/Y1/1 MinuteS44.0
B3dElectrical Endurance1.2.7.2--160h @ +125°CS41.5
B4(b)Bond StrengthDS-2011/DInternal Wire Pull, performed prior to Lid SealS21.5

Post Test End, Points for S/G's B3a, B3c, B3d---As AOb and A1--

Group C Periodic Tests

(3 Monthly Intervals)

SUB-
GROUP
TESTBS9400 para
(or DS - as detail spec)
Comparable Test MethodsCONDITIONSSAMPLE
CECC20000
Clause
MIL-STD-
883C Method
I.L.A.Q.L.
C1Electrical Endurance1.2.7.24.51005/BTamb=125°C, Duration 1000hS21.0
C2aDimensions1.2.34.2.22016-6.5
C2bImmersion in Cleaning Solvents1.2.6.18---
C2cVibration, Sinusoidal1.2.6.8.14.4.62007/A100Hz-2000Hz, 196m/s2, 15 Cycles in each Axis; 14700m/s2, 0.5ms Pulse, 5 Blows in each direction
Mechanical Shock1.2.6.64.4.52002/B
Fine and Gross Leak Tests1.2.6.144.4.101014/A & /C
C3Damp Heat, Steady State1.2.6.44.4.3-56 Days, No Loading

Post-Test End Points for S/G's C1, C2c, C3---As AOb and A1--

Group D Periodic Testing

(6 Monthly Intervals)

SUB-
GROUP
TESTBS9400 para
(or DS - as detail spec)
Comparable Test MethodsCONDITIONSSAMPLE
CECC20000
Clause
MIL-STD-
883C Method
nc
D1Dimensions1.2.34.2.22016-150
D2a(D)Lead IntegrityDS-2004/B2Bending Stress Test251
D2b(D)Adhesion of Lead FinishDS-2025-
D3a(D)Thermal Shock1.2.6.19
1011/B-55°C/+125°C, 15 Cycles (Test Nc)
Temperature Cycling1.2.6.134.4.41010/C-65°C/+150°C, 100 Cycles
Moisture ResistanceDS-1004
Fine and Gross Leak1.2.6.144.4.101014/A & B
Visual InspectionDS

D3b(D)Mechanical Shock1.2.6.64.4.52002/B14700m/s2, 0.5ms Pulse, 5 Blows in each axis
Vibration, Sinusoidal1.2.6.8.14.4.62007/A100Hz-2000Hz, 196m/s2, 15 Cycles in each Axis
Constand Acceleration1.2.6.94.4.112001/A49000m/s2 (5000g), Y1 axis, 1 Minute
Fine and Gross Leak1.2.6.144.4.101014/A & C
Visual InspectionDS-
D3c(D)Salt AtmosphereDS-1009/ATest Ka
Fine and Gross Leak Test1.2.6.144.4.101014/A & C
Visual InspectionDS--

Post Test End Points for S/G's C3b, C3c---As AOb and A1--

Notes

1. In these Tables, BS9400 is the referee test method; comparable methods are quoted for your guidance only.

Selection Guide

Isocom Ltd's devices are available either as:

  1. Standard High Quality Product; or,
  2. Quality Assessed Product with release to BS9000/CECC (without High Reliability Screening); or,
  3. 100% Screened Product with release to BS9000/CECC for High Reliability Applications.

Quality Assessment Categories

DEVICE
TYPE
DETAIL
SPECIFICATION
BS9400 CategoriesCECC20000 Categories
L2 L3 L4 UNSCR
EENED
B C D UNSCR
EENED
6N134BS9400 GO123YYYY
6N140ABS9400 GO124YYYY
4N55BS9400 GO125YYYY
CS200CECC20004-XXX
YYYY
CS201CECC20004-XXXYYYY
CD500CECC20004-XXYYYYY
CD501CECC20004-XXYYYYY
CS700BS9400 GOXXXYYYY
CD750BS9400 GOXXXYYYY
CS224CECC20004-XXZ
YYYY

Note: Isocom Ltd's policy is to release products to CECC requirements in preference to BS9000. The BS9400G - specifications quoted above will, therefore, be superceded by CECC detail specifications when suitable generic rules documents become available within CECC.

Ordering Information

Orders should state whether standard, quality assessed, or 100% screen product is required. As a typical ordering code example, device 4N55 would be 4N55 unscreened or non-released, but 4N55/L2 in assessment category L2.
For BS9000/CECC release orders should quote the detail specification (and issue) against which release is required, and the assessment category.
If in doubt please contact our representative or customer service department.

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